What does atomic force microscopy mean?
Definitions for atomic force microscopy
atom·ic force mi·croscopy
This dictionary definitions page includes all the possible meanings, example usage and translations of the word atomic force microscopy.
Wiktionary
atomic force microscopynoun
The science and technology associated with the design and use of atomic force microscopes
Wikidata
Atomic force microscopy
Atomic force microscopy or scanning force microscopy is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope in 1986. The first commercially available atomic force microscope was introduced in 1989. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale. The information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on command enable the very precise scanning. In some variations, electric potentials can also be scanned using conducting cantilevers. In more advanced versions, currents can be passed through the tip to probe the electrical conductivity or transport of the underlying surface, but this is much more challenging with few research groups reporting consistent data.
Numerology
Chaldean Numerology
The numerical value of atomic force microscopy in Chaldean Numerology is: 3
Pythagorean Numerology
The numerical value of atomic force microscopy in Pythagorean Numerology is: 1
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"atomic force microscopy." Definitions.net. STANDS4 LLC, 2024. Web. 22 Dec. 2024. <https://www.definitions.net/definition/atomic+force+microscopy>.
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